Used KLA / TENCOR SP1-DLS #9267041 for sale

KLA / TENCOR SP1-DLS is a leading-edge mask and wafer inspection equipment designed to deliver comprehensive monitoring and detection capabilities for advanced semiconductor processes. KLA SP1 DLS is a modular, high-throughput system capable of processing up to 600 wafers per hour across a wide variety of IC technologies, including cutting-edge FinFET. It features industry-leading 2D and 3D imaging technologies for optical and scanning electron microscope (SEM) views of mask and wafer surfaces. TENCOR SP 1-DLS can quickly detect defects and other features, including surface topology, pattern recognition, and overlay errors. Thanks to its inspection speed and accuracy, the unit can detect issues promptly and accurately, enabling corrections to be made and reducing the potential need for costly rework and repair. Furthermore, the machine features advanced image processing technologies and algorithms to support automated defect classification and identification. KLA SP1-DLS allows advanced analysis capabilities, including metrology inspection, layer-by-layer mask inspection, overlay error detection, and gap inspection. Its automated tool settings can be adjusted to ensure optimal parameter settings for a wide variety of marker types. This makes it easier to identify specific parameters for data analysis, which in turn helps optimize the asset's performance. The model also features advanced networking capability, allowing users to access data offsite in real-time. This ensures that analysis and data collection can take place in a variety of environments, enabling more efficient performance. Additionally, the equipment features a user-friendly graphical user interface (GUI) for fast, intuitive navigation of data collection and analysis tools. SP 1 DLS offers a comprehensive set of features that make it an ideal mask and wafer inspection system for modern semiconductor processes. With its reliable and accurate performance, fast processing speed, graphical navigation, and comprehensive analysis tools, the unit is a must-have for identifying and eradicating defects in the most advanced integrated circuit production processes.