Used KLA / TENCOR SP1 Surfscan DLS #9262807 for sale

KLA / TENCOR SP1 Surfscan DLS is a mask and wafer inspection equipment designed for high-volume production environments. It provides high throughput and accurate automated defect inspection. It is used for cutting-edge production of advanced ICs, MEMS, wafers, masks, and other microelectronic components. The system offers a high-resolution optical overlay for comparison of precisely aligned images. KLA SP1 Surfscan DLS can accurately measure the relationship between component parameters during the inspection. The unit is integrated with an array of Chroma Machine Vision technology allowing it to capture detailed images of these components with a large dynamic range. The machine also has an Automated Defect Recognition software that can detect a wide range of defects. TENCOR SP1 Surfscan DLS offers a variety of features that significantly reduce cost, time, and complexity associated with mask and wafer inspection. This includes automated inspection of particles, lines, marks, and other defects. It is equipped with automated calibration for repeatable results and also eliminates manual inspection processes. Themachine is also capable of parallel processing at a high-speed, up to 200 wafers per hour, allowing it tocomplete large inspection jobs quickly. It can be programmed with a number of recipe settings, allowing it to handle a wide range of different tasks and inspection criteria. Furthermore, SP1 Surfscan DLS is integrated with automated wafer mapping, providing an additional step in defect classification and eliminating the need for manual marking. It also has an intuitive user interface that can be used to program and change job settings quickly. The tool includes a wide coverage area and an advanced focus asset allowing user to inspect a wide range of different locations on a single wafer with confidence. Overall, KLA / TENCOR SP1 Surfscan DLS provides a high-performance mask and wafer inspection solution optimized for the industrial production environment. Its automated inspection capabilities significantly reduce time and complexity associated with wafer inspection, and its intuitive user interface makes it easy to program and adjust job settings. Its performance and reliability make it a great choice for production of ICs, MEMS, wafers, masks, and other microelectronic components.