Used KLA / TENCOR SP1-TBI #9249676 for sale

KLA / TENCOR SP1-TBI is a mask and wafer inspection equipment designed to identify defects in integrated circuits on the level of a single pixel. The system incorporates advanced optics and automation technology to provide speed and accuracy in inspecting masks and wafers for contaminants. KLA SP1T-BI is designed to inspect many types of materials and media such as silicon and stainless steel. The advanced imaging unit used in TENCOR SP1 TBI combines optical zoom capability and a high-resolution digital camera. This combination creates an image resolution that is greater than 200 megapixels. High-resolution, color, stereo, and 3D images are captured. These images are then processed with a 4 megapixel CCD to generate images with a 0.05um pixel pitch. KLA SP 1-TBI is able to analyze images rapidly, using a high-speed image processor. This processor works together with an advanced algorithm to give the users a broad view of the particular wafer or mask geometry being inspected, allowing them to determine the possible defects that exist in the material. This processor also allows images to be compared automatically while filtering out unwanted data or false positives. KLA / TENCOR SP 1-TBI is also equipped with advanced vision software which allows it to identify edges, individual pixels, or other physical features. This software can be programmed to identify defects as small as 0.1 micrometers, allowing the user to detect and inspect individual and minute defects that could be missed by the naked eye. In addition, SP 1-TBI has other features that prove beneficial to users such as automatic wafer positioning, automated mapping functions, and a suite of analytics for detecting defects in wafers. A unique and innovative viewfinder feature allows users to review images in real-time, without having to wait for data processing. KLA SP1 TBI is an essential tool in the development of very delicate miniature circuitry. It is often used in the semiconductor industry, providing detailed inspection for quality control purposes. By utilizing the combination of optical technology and advanced image processing, KLA / TENCOR SP1 TBI is able to deliver extremely precise results. With its robust performance, this machine is an ideal solution for finding and inspecting even the tiniest defects in a variety of materials.