Used KLA / TENCOR SP1-TBI #9261864 for sale

KLA / TENCOR SP1-TBI is a leading-edge, automated mask & wafer inspection equipment that allows for the rapid and accurate inspection of integrated circuits and other semiconductor components. Built to meet the precise demands of today's demanding fabrication processes, this inspection system ensures the highest level of quality and reliability from the production floor to the laboratory. The unit's proprietary imaging and analysis technologies allow for more precise detail detection and quicker results than any other equivalent machine on the market, allowing users to inspect a variety of components quickly and accurately. The optical design of KLA SP1T-BI has been optimized for use with specialty radiographs and LED sources, allowing for the most detailed imaging and analysis. With its robust and accurate imaging tool, the asset provides unmatched performance and reliability. Using an automated process control model, TENCOR SP1 TBI ensures that each test is accurately and reliably executed without the need for manual intervention. The equipment's patent-pending wafer magazine exchangeable system allows for easy reloading of cassette-look wafers, eliminating unnecessary steps and allowing for a fast and thorough inspection process. The unit's full-feature Defect Analysis package allows users to quickly and accurately diagnose any defects detected during inspection, and offers corrective actions to improve yields and reduce costs. The comprehensive image-editing tools also make it easy to view, analyze, and save images, allowing users to quickly inspect and correct defects. The machine's Temperature-Insensitive Beam Motion (TIBM™) ensures that each image captured is of the highest quality, even in rough manufacturing environments. The tool's axis compensation feature compensates for any atmospheric events, ensuring precise imaging accuracy at all times. KLA SP1 TBI is a highly capable and reliable asset, designed to stand up to the challenges of the world's most demanding mask and wafer inspection processes. Its advanced optical design, proprietary image and analysis technologies, and automatic process control capabilities mean that it can provide users with fast, accurate, and reliable results every time.