Used KLA / TENCOR SP1-TBI #9277484 for sale

KLA / TENCOR SP1-TBI is an advanced mask and wafer inspection equipment designed for the most demanding mask and wafer production environments. The system features a high-resolution, 12-megapixel CCD camera, which provides superior image contrast and sharpness over conventional systems. The unit allows for a wide variety of non-contact, automated inspection techniques such as differential interference contrast microscopy (DIC), brightfield microscopy (BF), darkfield microscopy (DF), focused ion beam (FIB), and scanning electron microscopy (SEM). The machine also enables the user to inspect a wide variety of different types of pattern features, including line widths, space and frequencies, as well as the presence of defects in finished masks and wafers. The tool is able to provide real-time, high-throughput data collection with automatic image acquisition, navigation, and optimization of inspection data. This allows for fast and accurate analysis and review of any defects or discrepancies found during inspection. KLA SP1T-BI also boasts a high sampling rate of up to 720 frames per second (FPS). This makes it suitable for fast inspection of high-resolution and high-frequency features. The asset also has a wide field of view, which can detect small defects in short periods of time. It also has advanced video processing capabilities that automatically detect and analyze defects using morphological algorithms. This helps to maximize the quantitative accuracy of the inspection data. TENCOR SP1 TBI also has a large memory capacity, allowing it to store images and processed data for long-term archiving and review. All the stored images and data can either be examined directly on the model's display or transferred to a PC for further analysis. In summary, KLA / TENCOR SP1 TBI is a powerful and advanced mask and wafer inspection equipment designed to provide the highest level of accuracy and speed. It features a high-resolution camera, a wide field of view, and advanced video processing capabilities, all of which enable rapid and accurate detection of defects. The system also has a large memory capacity and an easy-to-use interface for quick navigation and inspection data review.