Used KLA / TENCOR SP1-TBI #9290815 for sale

KLA / TENCOR SP1-TBI is a mask and wafer inspection equipment used for optical and electrical inspections of semiconductor wafers. The system uses a combination of high-resolution wafer imaging, spectral image analysis, and dedicated electrical test capability to ensure that all wafers are up to the highest standards and meet all manufacturer requirements. Inspections performed by KLA SP1T-BI unit are a combination of both optical and electrical methods. The optical inspection consists of a high-resolution wafer imaging machine that learns and stores an array of chip layouts and can identify any deviation in the features or structures in the chip layouts. The tool then utilizes spectral image analysis to compare and measure the differences between various layout elements. This allows the asset to detect any anomalies in the feature sizes, shapes, orientations and level of detail, as well as any defects that may arise due to process misalignments or non-conformances. TENCOR SP1 TBI model also features a dedicated electrical test inspection capability. This section of the equipment includes a high-speed electrical test module that is capable of testing and verifying the electrical characteristics of the devices being inspected. By measuring device parameters such as threshold voltage, leakage current, noise margin and switching characteristics, KLA / TENCOR SP1T-BI is able to guarantee the electrical performance of the semiconductor wafers being evaluated. KLA SP1-TBI system is capable of handling all types of wafers and advanced wafer formats, including silicon, gallium arsenide and SOI technologies. The unit is also capable of handling various technologies beyond CMOS, such as MEMS, solar, BiCMOS, and power technologies. The machine is capable of producing both 2D and 3D inspection images of the features and structures of the wafers, and is able to provide feedback on whether the features and structures meet the customer's requirements. TENCOR SP 1 TBI tool is a complete, multi-functional wafer inspection solution that can provide detailed analysis of wafer layouts and their associated electrical parameters, ensuring that the wafers are up to the highest standards. By combining dedicated electrical test modules, spectral image analysis, and high-resolution wafer imaging, KLA / TENCOR SP 1 TBI allows manufacturers to produce the highest quality semiconductor products quickly and reliably each and every time.