Used KLA / TENCOR SP1 #9024561 for sale

KLA / TENCOR SP1 is a mask and wafer inspection equipment designed to provide fast and reliable inspection of substrates for production control of semiconductor devices. This automated system offers precise visual inspection capabilities with a high resolution camera and advanced algorithms. The high resolution inspection capabilities of the unit allow for the detection of extremely small defects and contamination, while the advanced algorithms enable detection of subtle pattern deviations and edge errors. KLA SP1 machine consists of three main components. The first component is the optics, which is designed to provide superior imaging quality for the inspection process. The optical design incorporates a high-resolution, telecentric lens with a large aperture and an LED backlight. The second component is the hardware and software architecture of the tool. This asset is designed for maximum performance and ease of use, with a multitude of configurable options and settings. The model has user-friendly software with intuitive controls for automated inspection and manual operations, as well as a high-speed, 5x image acquisition option. The third main component of TENCOR SP 1 is its image analysis algorithms. These algorithms are designed to detect and analyze different types of defects or contamination on substrates. The equipment employs a variety of different methods, such as frequency coding, comparative mapping, and wavelet analysis, for accurate detection and classification of contaminants and defects. SP1 also incorporates a feature-based classification algorithm to identify the size, shape, and orientation of defects. KLA / TENCOR SP 1 system is capable of performing simultaneous visual inspection and defect analysis for substrates. This unit is capable of detecting and measuring a variety of particle contamination, line widths, and spacing measurements. The machine also has a comprehensive library of defect types and classifications, which can be customized for any specific application. KLA SP 1 tool is ideal for both manual and automated substrate inspection on production lines. Its user-friendly software, advanced algorithms, and high resolution optics provide flexibility and reliability for a wide range of inspection applications. By combining powerful image analysis algorithms and a versatile user interface, TENCOR SP1 asset offers an optimal solution for efficient and reliable substrate inspection.