Used KLA / TENCOR SP1 #9248076 for sale

KLA / TENCOR SP1 is an in-line mask and wafer inspection equipment specifically engineered to detect critical defects across the entire surface of a silicon wafer or mask. Its patented lighting technology, known as HDIR (High Definition Image Recognition) illumination, illuminates small defects that are not visible under common optical inspection systems. Its resolution reaches up to 4K x 4K, allowing it to detect defects only a few microns in size. The system is powered by an intuitive software that utilizes sophisticated algorithms and analytics to assess the defects automatically. It is designed to quickly identify them and generate comprehensive metrology reports, thus helping in the reduction of false positives and yield loss. The unit also features a machine for inline wafer mapping to quickly pinpoint and map the defect locations, as well as an autopilot feature that allows it to automatically run jobs with minimal user interaction. This tool is powerful enough to inspect both wafers and masks. For wafers, it can detect weak points, such as line-edge roughness and corner-shortening, as well as general contamination. It also detects pattern spacing for line width verification to ensure the wafer meets production requirements. For masks, it is able to detect masks that are contaminated with dust, particles or rust. The asset can also check for distinguishing marks, or identifying patterns, to ensure the mask meets production requirements. KLA SP1 model runs a full set of industry standard test suites for evaluation, enabling users to compare their results to those obtained from comparable systems. It is highly configurable to suit any process, application or environment, and is also compatible with multiple WLAN-enabled interfaces, allowing remote diagnostics and maintenance. Overall, the equipment is designed to deliver clean, accurate, and reliable results with no operator intervention. This makes TENCOR SP 1 an ideal solution for the semiconductor roofing industry and for designers who need to inspect their supplies. Its HDIR illumination technology and robust analytics help guarantee that the masks and wafers are defect-free and meet production standards.