Used KLA / TENCOR SP1 #9248730 for sale

KLA / TENCOR SP1 is a powerful mask and wafer inspection equipment designed for a wide range of applications. The system combines advanced metrology, identification, and yield management capabilities, so it can provide accurate and reliable insight into processing problems. It enables manufacturers to quickly identify and fix transistor, metal, and other defects that could otherwise lead to costly yield loss. KLA SP1 unit is designed to maximize performance and accuracy. It features two sophisticated optical items: the Dual Optical Sensor (DOTS) and the Quad Optical Sensor (QOTS). The DOTS utilizes KLA advanced line-scanning technology to inspect wafers images before and after steps, providing crisp images with high resolution. The QOTS is a 4-channel optical machine that offers even higher resolution. Both sensors can identify a wide range of defects such as particles, scratches, poor lithography, and overlay issues. TENCOR SP 1 also features an automated defect review module, which allows engineers and operators to quickly review and categorize potential defects, eliminating time-consuming manual analysis. KLA / TENCOR SP 1 also offers advanced yield management capabilities. Automated yield trending, binning, and classification features help identify trends in metal defects or transistor defects that would otherwise be difficult to measure. It also allows manufacturers to identify anomalies that may be missed by traditional methods, reducing yield loss due to undiscovered defects. SP1 is a powerful and cost-effective quality assurance tool. Its advanced metrology, identification, and yield management capabilities allow manufacturers to detect and correct process issues quickly, reducing scrap and improving yield. The tool is designed to handle the demands of the most demanding semiconductor manufacturing operations. It is backed by superior customer service and an extensive service network to ensure that it can quickly and efficiently address customer needs.