Used KLA / TENCOR StarLight 300 SL300 #9083887 for sale

KLA / TENCOR StarLight 300 SL300 is an advanced mask and wafer inspection equipment designed to provide the highest level of accuracy and precision in detecting defects in the production process. With the capability of a superior resolution, the SL300 is capable of detecting even the most minute defects with only the slightest change in reflectivity. The system also has the potential to transform production times, reducing costly re-work through improved efficiency and accuracy. KLA StarLight 300 SL300 is engineered to field multiple wavelengths which allows it to quickly analyze a wide range of problem areas. The unit has an enhanced mask detection technology which relies on a specialized optical inspection technology to identify the tiniest of flaws. The SL300 can quickly identify and locate defects in complex line widths, even on the most challenging masks. In addition, it also has the capability to detect defects on both metallic and non-metallic wafers. The machine also offers several specialized features, including a multi-channel mode, which enables a single inspection algorithm to process multiple light signals. This helps to reduce operator bias errors from multiple manual inspections and ultimately results in faster defect detection. The SL300 also offers the capability to define user-defined inspection parameters to further enhance the flexibility of the tool. The SL300 is equipped with a high-resolution CCD camera which captures extremely accurate defect images which are then processed by sophisticated hardware and software algorithms. After undergoing the analysis process, the asset then produces a report which identifies the specific type and location of each defect which can be quickly identified and isolated in order to determine the root cause. Finally, the SL300 model includes a wealth of accessories and software which further enhance the ease and flexibility of operation. The optional Acquisition and Analysis software enables the fastest access to the capture data, as well as precise defect detections on the fly. In addition, customers can also benefit from software options such as automated defect analysis, multiple sample modes and color inspection which further reduce the need for prolonged, manual inspection times. TENCOR StarLight 300 SL300 is an advanced mask and wafer inspection equipment designed to provide the highest level of accuracy and precision in detecting defects in the production process. With its superior resolution, multi-channel mode and optional feature software, the SL300 is the perfect choice for production environments seeking a robust, reliable and time-effective inspection system.