Used KLA / TENCOR STARlight SL3 Series #9101332 for sale

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ID: 9101332
Lot of PCB's: (1) P/N: 710-060329-00 (1) P/N: 710-034287-00 (1) P/N: 710-032926-00 (1) P/N: 710-057895-00 (1) P/N: 710-034282-00 (3) P/N: 710-034292-00 (1) P/N: 710-034302-00 (1) P/N: 710-060031-00 (1) P/N: 710-060914-00 (1) P/N: 700-032926-00 (3) P/N: 710-058894-00 (1) P/N: 710-057306-00 (1) P/N: 710-057306-00 (1) P/N: 710-058063-00 (2) P/N: 710-058894-002 (1) P/N: 710-058895-003 (6) P/N: 710-060914-00.
KLA / TENCOR STARlight SL3 Series is a cutting-edge inspection equipment designed to provide in-depth analysis into both masks and wafers in the semiconductor manufacturing industry. The system utilizes advanced imaging technology to inspect all layers of the product with a high level of accuracy and resolution. KLA STARlight SL3 Series consists of three models: the SL3000, SL3200, and SL3100. Each model has its own unique features designed to meet the needs of various customers. The SL3000 is equipped with a high throughput automated wafer inspection unit and a large area wafer inspector for detecting defects in both masks and wafers. The SL3200 series features a wafer inspection machine which is specifically designed for inspecting large area wafers and provides superior resolution and accuracy. The SL3100 model provides full wafer defocus capability and a high resolution sensor for inspecting both masks and wafers as well. TENCOR STARlight SL3 Series provides a variety of inspection features including surface defect inspection, defect isolation, CD and film measurement, overlay metrology, lithography pattern assessment, as well as die-to-die defect detection. Each of these features is designed to provide customers with a comprehensive view into the quality of their products. The tool also includes a particle inspection feature which detects and isolates particle contaminants on the wafer. In addition to providing superior product inspection capabilities, STARlight SL3 Series also offers a host of advanced software features, including a defect review module, an automatic defect remapper, a critical dimension analytics tool, a defect clustering tool, and a defect analysis tool. These software features optimize the workflow of the entire inspection process and ensure that customers are able to quickly spot defects and improve their process control. KLA / TENCOR STARlight SL3 Series combines the best of both worlds: high-performance imaging technology and sophisticated software tools. In combination, these two features provide customers with a comprehensive view into the quality of their products. The asset is designed for both production and R&D customers, providing them with the solutions they need to improve quality and reduce cycle times. By leveraging the advanced imaging technology and software of KLA STARlight SL3 Series, customers are able to ensure that their products meet the highest standards of quality and consistency.
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