Used KLA / TENCOR Surfscan SP1 Classic #9224666 for sale

KLA / TENCOR Surfscan SP1 Classic is a highly precise yield-enhancement equipment designed to maximize the production yield of integrated circuits (ICs) through an automated mask and wafer inspection process. The system's advanced technology increases IC yield by identifying defects and poor equipment performance. KLA Surfscan SP1 Classic features seven products, including mask and wafer inspection tools, wafer measuring and inspection systems, and other production tools. All of these components collaborate to streamline and enhance IC fabrication. Its mask inspection unit, for instance, uses automated defect detection algorithms to quickly identify minute, lifecycle-attenuated defects in IC mask patterns. It also comes with an advanced optical machine for measuring alignment accuracy to check for misalignment and overlay errors. TENCOR Surfscan SP1 Classic's wafer inspection systems leverage cutting-edge optics and algorithms to detect and characterize semiconductor defects across all wafer layers. Extended direct wafer scanning enables the tool to quickly detect bumps, particles, and dishing faults, which are important indicators of yield-enhancing issues. The asset also features an automated defect review model that can flag, prioritize, and review defect events. KLA other production tools empower users to optimize IC yields. The WaferCap tool, for example, measures and compares critical IC parameters across all IC chips on the wafer. Meanwhile, the YieldQ software platform offers robust analytics and macro control functionality, helping IC manufacturers get the most out of their production processes. Surfscan SP1 Classic's sophisticated diagnostic capabilities ensure greater production yield, helping customers identify and fix defects that could otherwise lead to yield reductions. By detecting and resolving invisible problems, KLA / TENCOR Surfscan SP1 Classic increases production throughput, reduces manufacturing costs, and boosts customer satisfaction.