Used KLA / TENCOR Surfscan SP2 XP #293609839 for sale

KLA / TENCOR Surfscan SP2 XP is a mask & wafer inspection equipment designed for inspecting processed semiconductor wafers and masks in order to detect any defects, contamination or irregularities. It supplies advanced defect detection capabilities through the use of its advanced silicon imaging, defect review and analysis software. Featuring state-of-the-art technologies, through software, optics, and hardware all integrated together, users are able to effectively achieve higher yield and reliability throughout the production process. KLA Surfscan SP2 XP system offers users with advanced defect detection capabilities with an array of features, such as backside inspection, color imaging, show and tell defect classification, classification by contrast, sub-pixel charging and computing, along with a fully integrated defect review unit. This gives users the capability to detect and review all of the defects on both the front-side and back-side of the wafer and masks in both 2D and 3D slices. The machine has the capacity to accommodate up to 8 wafer prints per cycle and features a high-powered x-ray source that provides user friendly operations via its automated step & repeat feature, allowing for uniform image acquisition with improved data transfer capability. Furthermore, the tool employs bright-field, dark-field and near-field scanning modes, allowing users to achieve the highest optical resolution while acquiring high contrast images with minimal flare. The mask & wafer inspection capabilities of TENCOR Surfscan SP2 XP asset are further enhanced through its multi-stage laser-scanning model for wide-field imaging combined with an in-plane sca nner. By integrating these techniques into the equipment users have the ability to capture very fine details, detect potential contamination or irregularities on the surface of the wafer, and rapidly identify defects with the fully automated job preparation and classification. Additionally, the system has an integrated environment analysis and defect failure analysis feature a lay of the land inspection software package, which supplies detailed information about the environment that the sample was checked under and also provides data analysis and reporting of the defects found throughout the inspection. To sum up, Surfscan SP2 XP offers users a top-of-the-line wafer and mask inspection unit with powerful features and capabilities, allowing them to efficiently and accurately detect and review defects on the front and backside of the wafer and masks with high optical resolution. This machine provides users with the highest level of inspection capability and the features contained within make it perfect for high-quality wafer and mask manufacture.