Used KLA / TENCOR Surfscan SP2 #293607017 for sale

KLA / TENCOR Surfscan SP2 is a mask and wafer inspection equipment that provides accurate, reliable, and comprehensive measurements of defects on mask and wafer surfaces. The system is designed for automatic, non-destructive, two-dimensional surface inspection of semiconductor devices and other advanced optical, electronics, and microelectronic products. It is integrated with a sophisticated, easy-to-use software suite offering comprehensive, automated, and repeatable results. The unit uses a proprietary laser scanning and imaging technology to capture images of the sample, at a spatial resolution of 67 nanometers. This high-resolution imaging is crucial, as it allows even the smallest defects to be accurately detected and analyzed. The machine inspects for a wide range of defects, including multiple patterning defects, voids and bridges, line width defects, particle defects, and other surface irregularities. The tool also has excellent sensitivity to mask and wafer defects such as contaminants and CD variability. The advanced analysis algorithms in KLA Surfscan SP2 asset allow the user to isolate and measure the defects, as well as perform statistical analysis and report generation. This helps engineers and design specialists better understand the defect characteristics of their products, and to make quick, informed decisions. The integrated data management model supports a variety of formats for data storage and extractions, allowing for easy data download and analysis. Multi-perspective viewing capabilities also give engineers the ability to quickly and easily review multiple defect perspectives, as well as adjust settings and parameters to fine-tune inspection results. This can be especially beneficial when trying to determine if a defect is real or false. TENCOR SURFSCAN SP 2 equipment offers a quick and easy way to conduct manual inspection when needed. Finally, the system offers standardization and traceability of data throughout its operations. This ensures the accuracy and repeatability of the data gathered, and provides absolute traceability of results back through the original design and testing. With KLA / TENCOR SURFSCAN SP 2 unit, mask and wafer inspection can be conducted quickly, accurately and reliably, providing vital insights into the design, fabrication, and performance of semiconductor devices.