Used KLA / TENCOR Surfscan SP2 #9411858 for sale

KLA / TENCOR Surfscan SP2 is a state-of-the-art mask and wafer inspection system for quality assurance and process control applications in semiconductor manufacturing. KLA Surfscan SP2 combines advanced macro inspection capabilities and advanced imaging technology to bring maximum inspection speed, accuracy and sensitivity for detailed analysis of any photomask or wafer. TENCOR SURFSCAN SP 2 offers a comprehensive suite of inspection technologies to quickly and efficiently analyze all levels of wafer and photomask details. With its advanced high-resolution imaging capability, KLA SURFSCAN SP 2 captures macro and micro images with superb detail and accuracy. Furthermore, it also applies a variety of advanced defect detection algorithms to detect any defects with exceptionally high accuracy and speed. For fast and accurate identification of defects, KLA / TENCOR SURFSCAN SP 2 can capture images at up to 500x magnification with high-quality resolution to provide a detailed representation of different structures on the device. After the data has been collected and processed, TENCOR Surfscan SP2 uses precise pattern matching algorithms to accurately identify potential defects and anomalies with considerable speed. Surfscan SP2 also captures defect coordinates both on the surface and at the cross-section to enable precise defect mapping. Plus, its edge-enhancement features make it easier to inspect for microshort and microopen defects with maximum accuracy. Further, SURFSCAN SP 2 provides precise volumetric surface texture mapping and defect analysis capabilities, enabling precise defect isolation and analysis. For maximum efficiency, it also offers pre-installed analysis programs such as CD Split, Advanced Analysis, PBE, Edge-Metrology and Stress Analysis, to name a few. Moreover, KLA / TENCOR Surfscan SP2 includes an intuitive graphical user interface for simpler and faster user-guided inspections and data processing for shorter cycle times and improved yield. Also, it is compatible with Windows, Mac and Linux operating systems, allowing quick integration into existing production and research environments. Overall, KLA Surfscan is a highly advanced and feature-rich mask and wafer inspection system that provides superior speed, accuracy, and sensitivity, enabling maximum yield and process control.