Used KLA / TENCOR Surfscan SP3 #293645338 for sale

KLA / TENCOR Surfscan SP3 is a powerful mask and wafer inspection equipment designed to provide high accuracy and high speed inspection of masks and wafers across a wide range of industries. It is an effective tool for identifying nanometer-scale defects on lenses and other components of advanced manufacturing processes. It is also used in the semiconductor industry. KLA Surfscan SP3 employs a 60 cm scan field allowing for imaging semiconductor dies up to 300 mm. The system features one-micron pixel resolution, surpassing the highest industry standards, and a dynamic range of 1-120 dB. Using advanced algorithms, TENCOR Surfscan SP3 can detect both bright and dark defects in a matter of seconds. Additionally, its robust optical unit is equipped with multiple detectors and light sources to ensure maximum performance, depth of field, and field uniformity. When it comes to software, Surfscan SP3 has an advanced operating machine and powerful, cost-effective process automation tools. It uses the True Scan Disparity Analysis (TSDA) tool to automatically detect, measure and classify defects. Additionally, KLA / TENCOR Surfscan SP3 includes a comprehensive library of predefined inspection parameters and reporting capabilities that can be easily adapted to the customer's specific needs. The innovative hardware and software capabilities of KLA Surfscan SP3 allow customers to monitor process trends in real-time, avoiding costly delays. Finally, the intuitive and easily configurable graphical user interface makes it intuitive and simple to control and manage production runs. TENCOR Surfscan SP3 is the state of the art in mask and wafer inspection and offers reliable and accurate performance at a competitive price. With its extraordinary optics and cutting-edge algorithms, it is an invaluable tool for the high-end semiconductor and microelectronics industries. This versatile and cost-effective inspection asset is ideal for any cleanroom setting and provides an efficient and reliable way to detect and classify process defects in the production of integrated circuits.