Used KLA / TENCOR Surfscan SP3 #293650551 for sale

KLA / TENCOR Surfscan SP3 is an automated mask and wafer inspection equipment. It offers rapidly-scalable production capabilities, with both low-cost and high-performance options. KLA Surfscan SP3 is designed to streamline all aspects of mask and wafer inspection, from advanced defect review to comprehensive data management. The system boasts a wide variety of features, allowing for reliable and consistent inspection in semiconductor fabrication facilities. TENCOR Surfscan SP3 offers advanced imaging technology through a variety of optics, enabling the unit to detect a wide range of particles, defects and other detail down to very small sizes. The machine also includes an array of repeatable and customizable optical modules, which allow users to tailor the tool to the demands of their particular application. The asset employs automated image analysis algorithms to maximize accuracy and eliminate human bias or error from the inspection process. This ensures consistent, unbiased results and minimizes the need for manual review. In addition to advanced optics, Surfscan SP3 also features several modules for data management, process control and sample management. The model's Data Acquisition module allows for the organization and retrieval of library data for automated review and analysis, as well as for detailed camera calibration and review. The Coordinates Database module ensures accurate measurements over the entirety of a wafer by tracking layout and worksite information. Lastly, KLA / TENCOR Surfscan SP3's Sample Management module makes it easy to track and manage data across multiple users and multiple devices. The equipment also boasts several advanced algorithms to ensure the highest possible accuracy and reliability in the inspection results. For example, the Mask Geometry and Edge Detection algorithm allows for the detection of variation between multiple images. The Sub Layout verification algorithm is a unique feature that detects potential issues with alignment and positioning on the chip. The LED Feature detection algorithm can further assist with finding critical defects that may be difficult to detect through normal inspection methods. KLA Surfscan SP3 is an indispensable tool for quality control in a semiconductor fabrication setting. With its highly-accurate imaging, automated data management and powerful algorithms, the system is designed for the fast-paced environment of semiconductor manufacturing. It's an ideal choice for any semiconductor production facility that is looking to improve their quality control and inspection capabilities.