Used KLA / TENCOR UVision 5 #293586464 for sale

KLA / TENCOR UVision 5 is an advanced automated mask and wafer inspection equipment designed to detect anomalies in semiconductor materials prior to manufacturing. Using high-resolution optics and patented inspection algorithms, it can inspect very fine details of a mask or wafer's surface for defects, such as scratches and contamination. With improved measurement sensitivity and accuracy, KLA UVision 5 is capable of detecting even the most subtle mask and wafer defects. TENCOR UVision 5 utilizes multiple high-resolution environmental detectors to investigate wafers and masks without the need for costly system calibrations or additional components. Using special multi-axis motion control and imaging unit, UVision 5 provides precise measurements and analysis of surfaces in both macro and micro scale. Furthermore, KLA / TENCOR UVision 5 utilizes deep learning and artificial intelligence techniques to detect and differentiate defects and contaminants. KLA UVision 5's automated imaging and measuring systems can detect any contaminated particles, including debris, dust, and other contaminants, which can adversely affect the performance of semiconductor devices. The machine can be used to evaluate wafers made from a variety of materials, such as silicon, glass, and olymers. The tool provides a detailed overview of any part of the mask or wafer by utilizing its high-resolution imaging technology and image fusion capabilities. The asset also includes a user-friendly interface, which enables operators to quickly access the data and customize their mask or wafer inspection. It also offers margin analysis, where operators can compare the pre- and post-inspection results to ensure quality consistency. The model can be operated in either a full manual or semi-automatic mode and is designed to capture any sample related to quality or manufacturing variation for further study. TENCOR UVision 5's automated inspection equipment also provides support for traceability and compliance with regulatory standards. It comes with integrated compliance and data-tracking software, which ensures that all data collected by the system is securely stored in a central server unit. UVision 5 also allows for extended analysis of inspection results, including pattern recognition and statistical process control. The advanced features of the machine provide the visibility, data reliability, and information accuracy required to meet the high demands of the semiconductor industry.