Used KLA / TENCOR WI-2250 #293607201 for sale

KLA / TENCOR WI-2250 is a mask & wafer inspection equipment that delivers high quality defect detection performance for semiconductor manufacturers. It features advanced technologies such as its patent-pending WaveSightTM imaging technology, which provides up to 50% improved sensitivity compared to traditional patterning solutions. It uses pulsed laser beams and a high resolution CCD camera to perform critical inspection on the most complex defect features, offering the most reliable and accurate results. The system is suitable for applications including inspection of optical masks, photomask patterns, defect inspection and metrology, chip-to-chip inspection, overlay metrology, wafer-to-wafer imaging, and more. It is designed to detect even very small defects such as pinholes, scratches, and dust particles as small as 0.2 microns. The inspection unit provides superior image quality, enabling reliable defect coverage and fast throughput. KLA WI-2250 also features auto-focus and auto-calibration capabilities, enabling easy operation and quick startup time. No operator is required for routine operation, and the machine can be easily trained and updated to meet wafer inspection needs. The optical tool consists of a patented interferometer, a telecentric imaging asset, a 5x optical zoom lens, an integrated illumination module, and a high-resolution CCD camera. The imaging process is also compatible with SPC (statistical process control) to ensure that new process recipes are realized for each new layer. TENCOR WI-2250 model is capable of providing high-precision measurements for mask evaluation, circuit and die pattern identification, and overlay metrology applications. It complies with the latest industry standards for 3D evaluation and is backed by a warranty to ensure quality and reliability. WI-2250 is an ideal choice for mask & wafer inspection and is suitable for applications in the most advanced semiconductor device manufacturing processes. It offers superior sensitivity to detect defect features down to 0.2 microns, reliable defect coverage, and fast throughput, making it the perfect choice for all your defect inspection needs.