Used LASERTEC 9MD82SRII #9362970 for sale

LASERTEC 9MD82SRII is an advanced mask and wafer inspection equipment that leverages the latest technologies to provide a ccalled-state-of-the-art experience in automating defect detection and analysis on semiconductor masks and wafers. The twin laser beam inspection system uses two lasers, one to analyze defects and another to observe the wafer's overall properties and surface imperfections. An array of high-resolution cameras allows for detailed physical inspection of masks and wafers while simultaneously capturing electrical information by way of Advanced Novec software. The Insight Suite software provides users with a host of options for automating defect analysis with full control and capability to customize settings to fit customer needs. LASERTEC 9MD82SR II scanning unit consists of a dual-strike laser, a high-resolution camera, and an advanced, automated. The machine's dual-strike laser ensures fast and accurate scanning of micro-devices, with the capability to detect particles and contaminants as small as 1 micron in size. In addition, the high-resolution color camera captures extremely high-resolution image, allowing for inspection and analysis on nanometer-scaled chip structures. The automated calibration functions in the tool enables the user to customize settings to his or her requirements in order to optimize detecton performance and accuracy. Simultaneously, the Novec software suite, provides all of the necessary software tools for mask and wafer inspection, offering a comprehensive inspection report capabilities and mask-to-mask comparison along with full interactive analysis. The Viewer software tool allows for visual verification and comparison of test reports and images sets, providing an in-depth look for users to make decisions and take corrective actions. Furthermore, 9MD82SRII provides advanced asset logging and data-mapping, allowing users to quickly generate performance analysis and statistics. 9MD82SR II, provides state-of-the-art features to ensure accuracy and efficiency, while integrating advanced visual and electrical inspection capabilities in one automated solution. This powerful and cost-effective model is ideal for semiconductor mask and wafer inspection applications, providing a superior user experience with flexibility and control.