Used LASERTEC M8351 #9230283 for sale

LASERTEC M8351
ID: 9230283
Wafer Size: 12"
Blank inspection system, 12".
LASERTEC M8351 Mask & Wafer Inspection Equipment is a high-precision optical inspection system designed to inspect and measure surface defects on the masks and wafers in production lines. The unit provides high-speed and high-resolution inspection and measurement for semiconductor devices, enabling fast and accurate detection of defects. The main components of LASERTEC M 8351 include a multi-wavelength lens-coupled laser scanner, a high-precision stage machine, advanced software, and a frequency-stabilized laser source. The scanner utilizes spectral scanning technology to detect and image defects from a wide range of materials. The advanced software includes powerful feature recognition algorithms and advanced image processing capabilities for nanometric measurements and precise defect identification. The tool is capable of detecting defects down to 5 nanometers, with a resolution of up to 10 angstroms. M8351 offers a range of inspection and measurement features including defect classification, defect mapping, contact hole inspection, 2D edge inspection, MOS wafer surface inspection, as well as laser microscope functions. Its high-speed operation and automated workflow support automated inspection and measurement of difficult samples. Additionally, the asset can be combined with an advanced optical surface characterization model to provide an integrated wafer metrology solution for examining the surface of wafers and defects. Thanks to its unique combination of advanced hardware and software, M 8351 offers reliable and reproducible inspection and measurement results that are essential for industry leading security and reliability. The equipment operates with high accuracy and precision and is suitable for a wide range of industry requirements from process and reliability control to advanced failure analysis. In addition, its intuitive user-friendly interface ensures easy operation. Overall, LASERTEC M8351 is a powerful, reliable, and accurate mask and wafer inspection system with features designed to inspect and measure surface defects on a wide range of materials. Its precise defect detection, multi-wavelength scanner, and high-speed operation make it ideal for production lines. With its wide range of features, LASERTEC M 8351 is the perfect choice for quality control in the semiconductor industry.
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