Used LAYTEC EpiTT #9201288 for sale

LAYTEC EpiTT is a sophisticated and advanced mask and wafer inspection equipment that utilizes an optical microscope coupled with four different illumination technique systems. This system is designed for finer pattern analysis as it allows micrometer level resolution and high contrast imaging of wafers. It can also detect nanometer scale defects and features with its combination of bright field, dark field, reflectance, and fluorescence illumination techniques. The unit incorporates a computer controlled inverted optical microscope, the ability to zoom in and out, and the ability to focus on different features down to 10 nanometers. This allows for incredibly detailed imaging of defects on the surfaces of wafers. Additionally, EpiTT features an automated die motion machine, which enables easy and efficient scanning and examination. There is a selection of different cameras available to use with LAYTEC EpiTT, including both color and monochrome options. Depending on application requirements, either one can be used, providing much more flexibility in terms of features and capabilities. For example, a color camera may be preferable for its ability to detect different types of defects that would otherwise go unnoticed on a monochrome-only tool. EpiTT also incorporates a powerful image analysis software package that is tailored for measuring various parameters of the imaged wafer. This package includes a suite of measurement tools such as optical pixels comparison, edge detection, grayscale determination, and contrast adjustment. It is designed to greatly improve efficiency and accuracy when examining different portions of the wafer as well as inspecting for potential defects. Furthermore, the software package also offers a wide variety of different analysis algorithms, enabling quick and reliable defect and feature measurements. Overall, LAYTEC EpiTT asset is a powerful and efficient tool that can be used for mask and wafer inspection with great accuracy and detail. It is equipped with a variety of instruments and components that can be configured to suit any application, such as bright field, dark field, reflectance, and fluorescence illumination techniques, as well as the latest image analysis software package. With these capabilities, EpiTT provides high performance results and top quality imaging and measurements, making it an indispensable tool for mask and wafer inspection.