Used LEICA INS 3000 #9200394 for sale

LEICA INS 3000 is a state-of-the-art mask and wafer inspection equipment. It has the industry's highest resolution and magnification capabilities and is suitable for the most demanding inspection applications. The system combines a high-precision optical unit with a high-powered imaging machine. This combination makes LEICA INS-3000 ideal for detecting tiny defects in integrated circuits and other components. The tool incorporates a unique, compact optical design with a motorized hemisphere mirror, which ensures clean and uniform lamination across the entire inspected area. The detection accuracy of this asset is 0.5um, which is ideal for inspecting semiconductor masks and wafers. Furthermore, INS 3000 has an advanced CCD camera capable of capturing up to 4K resolution images. These high-resolution images help users to clearly identify minute, even sub-micron defects or particles that could lead to production problems. INS-3000 features a multi-step inspection model with both quick and detailed examination capabilities. This equipment inspects every pixel and detects any minute non-conformity in the wafers or masks. Additionally, the system comes with software that allows it to adjust the levels of color and contrast automatically to ensure accurate results. LEICA INS 3000 can handle large volumes of data quickly and easily, and its sleek user interface makes it easy for users to control the unit and interpret the inspection data. The machine also includes a comprehensive reporting and analysis feature, which users can use to generate detailed inspection reports. The tool is also highly reliable and virtually maintenance free, making it the ideal choice for mass production. LEICA INS-3000 is a powerful and reliable mask and wafer inspection asset that provides unparalleled accuracy and efficiency. It's easy to operate, highly reliable, and offers excellent resolution. The model is an ideal choice for any semiconductor manufacturer who wants to ensure quality and accuracy in the inspection process.