Used LEICA INS 3000 #9412578 for sale

LEICA INS 3000 is a mask and wafer inspection equipment designed for semiconductor inspection. It is a high performance, high precision system capable of providing inspections that meet all major semiconductor industry standards. LEICA INS-3000 utilizes high-resolution CMOS and CCD detectors along with objective lenses to systematically scan wafers and masks for a range of semiconductor defects. The unit offers a wide range of inspection modes including pitch-extracted, split imaging, and full-field inspections. Pitch-extracted inspections are useful for analyzing closely-spaced patterns on the masks, while split imaging is designed to detect certain types of defects in both dense and dispersed patterns. The full-field inspections allow for the highest level of resolution and accuracy, as they scan and compare each pixel on the mask with exact precision. INS 3000 also utilizes advanced image processing techniques. These include automated alignment, defect classification and multi-scale analytics that enable the machine to consistently identify defects. In addition, the tool's innerviewer technology provides real-time feedback to alert the user whenever a defect is detected. The asset is designed to be easy to use and provides integration options with a variety of software and hardware components. The user friendly interface is streamlined for fast and efficient operation, and the automated alignment and measurement functions simplify the process of setting up inspections and checking results. INS-3000 is an ideal mask and wafer inspection model for any semiconductor production application. Its resolution and accuracy make it extremely reliable for detecting and analyzing a variety of semiconductor defects. The equipment is highly user-friendly, making it simple for operators to set up and run the system quickly and effectively. With its extensive range of inspection modes and advanced image processing capabilities, LEICA INS 3000 provides an efficient and reliable method for performing comprehensive semiconductor inspections.