Used LEICA INS 3300 #9285724 for sale

LEICA INS 3300 is a state-of-the-art mask and wafer inspection equipment designed to deliver high-resolution, precise imaging performance in the testing and inspection of miniaturized electronic components. It features an advanced optical design that is tailored to the high-performance imaging needs of wafer and mask inspection. A combination of high-resolution optics, multi-exposure imaging, and optimized software provides superior imaging performance, providing maximum accuracy with low total cost of ownership. The system includes multiple detectors, such as a charge-coupled device (CCD), or complementary metal oxide semiconductor (CMOS) imager, which provide high-resolution imaging performance. The imaging lens range available includes a 4x objective with an aperture range of f/2.8-5.0, and a 10x objective with an aperture range of f/8 to f/13. Designed with an industry-standard epi-fluorescence configuration, the unit is outfitted with a V-mount imaging chamber and a robust control platform including a master control module, controller unit, and imaging control software. LEICA INS3300 offers a host of imaging and inspection capabilities. These include feature measurement, image capture, pattern recognition, wafer alignment, spectral analysis, pattern comparison, defect detection and defect analysis. In addition, the machine includes algorithms specifically designed for semiconductor device inspection, enabling more precise identification of defects in mask, wafer, and package manufacturing processes. The tool also features automated calibration routines and automated defect recognition, enabling greater efficiency and accuracy in the detection of defects. INS 3300 is also well-suited for use in semiconductor metrology applications, featuring automated feature-measurement capabilities, and algorithms optimized for line-width measurements, process-centric measurements and statistical measurements. Designed for superior metrology performance, the asset is also equipped with tools for rapid data analysis, visualization and reporting. INS3300 delivers high-resolution performance in a compact form factor and is an ideal solution for a variety of semiconductor inspection and metrology applications. Offering a full suite of features designed to maximize performance, and optimized software for improved analysis and reporting, the model is ideal for those requiring unparalleled performance in the inspection and metrology of semiconductor devices.