Used LEICA INS 3300 #9410296 for sale

ID: 9410296
Vintage: 2003
Wafer inspection system FOUP Loadport, 12" 2003 vintage.
LEICA INS 3300 is a mask and wafer inspection equipment specifically designed for the inspection of high-end microelectronic devices. It has been developed by German precision technology company, LEICA Microsystems, to ensure production-level speed and precision when inspecting these highly complex components. The system is composed of several components: an integrated beam delivery unit for optimal illumination and imaging, a field emission gun for high-resolution inspections, a recoating modules for sample preparation, and a multi-axis motor machine for controlling sample position. All of these components are housed inside a robust and modular housing unit. This proprietary design maximizes the tool's flexibility and versatility, making it ideal for use in a range of semiconductor processes and product applications. LEICA INS3300 features an intuitive user-friendly interface, making it easy to move between different modes of operation, such as auto-navigation, an overlay comparison tool, and pattern comparing. This allows engineers to quickly configure the asset to meet specific inspection requirements with ease. Additionally, the model offers a range of user-selectable imaging modes such as close-up zoom, maximum image size and single chip masks, as well as repeatable inspection parameters and areas of interest. Unique features of INS 3300 include its fast start-up time, high-precision nanometer accuracy and the ability to image large areas without compromising image quality. As well as this, its modular architecture allows for easily interchangeable parts and easy maintenance. Overall, INS3300 is a state-of-the-art mask and wafer inspection equipment that offers unparalleled levels of speed, precision and flexibility. It is ideal for use in semiconductor and microelectronic processes, offering fast start-up time and a range of user-friendly imaging modes for optimal results. In this way, it ensures that any defects are identified quickly and accurately, and with minimum associated energy costs.
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