Used LEICA INS 3300 #9412579 for sale

LEICA INS 3300
ID: 9412579
Wafer inspection system.
LEICA INS 3300 is a customized and highly automated mask and wafer inspection equipment that provides superior image quality. This system is specifically designed for mask and wafer inspection, which enables users to accurately identify potential defects in their substrates. Additionally, with its integrated Image Pre-Processing technology, LEICA INS3300 unit can detect a wide range of defects down to 0.061µ. INS 3300 is equipped with a large, two-dimensional interchangeable digital microscope to precisely measure substrates, as well as its advanced inspection algorithms which can recognize complex patterns and colors. This machine also includes high-end digital cameras with 8 megapixel lenses that allow the user to program and adjust the zoom, rotation and lighting qualities of the image. In addition to its powerful capabilities, INS3300 is designed to be user-friendly and intuitive. This tool is equipped with a large Touch with Gesture controlled user interface, enabling users to quickly set up and operate their asset. LEICA INS 3300 is also integrated with an advanced software model that is capable of rapidly detecting defect positions and substrate quality measurements. LEICA INS3300 also features advanced defect analysis features that allow users to quickly analyze defects and substrates. This equipment's integrated Autonomous Inspection Features allow users to program and adjust their inspection parameters, as well as the ability to export results to spreadsheets for detailed analysis. Additionally, INS 3300 utilizes advanced algorithms to provide accurate and reliable defect detection. In order to ensure a reliable and consistent inspection, INS3300 system is equipped with a range of robust mechanical and optical components. These components provide a reliable workflow while also making it easy to interchange different substrates and test objects. Additionally, LEICA INS 3300 has an automated temperature and humidity monitoring unit which allows users to control the environment in order to maintain a consistent and accurate operation. Overall, LEICA INS3300 provides an exceptional mask and wafer inspection machine which offers superior image quality and a range of features to make inspection and analysis simple and efficient. With its advanced features, robust tool components, and intuitive user interface, INS 3300 is the ideal asset for mask and wafer inspection.
There are no reviews yet