Used LEICA INS 3300 #9412588 for sale

LEICA INS 3300 is a mask and wafer inspection equipment designed to ensure the quality of silicon wafers used in the semiconductor industry. The system is capable of detecting defects in patterned images at the sub-micron level and accurately measuring the dimension and shape of objects on the wafer surface. Utilizing an advanced optical microscope and high-resolution camera, LEICA INS3300 can magnify wafer images up to 2000x their original size. This allows for precise scrutiny of the fine microscopic components contained within the wafer. A sophisticated image processing engine then utilizes image recognition algorithms to uncover any irregularities in the images that may be indicative of defects. INS 3300 also incorporates a powerful lens-free inspection technology, which enables the unit to detect defects without having to zoom in on the image at multiple levels. This enables the machine to inspect a wafer more quickly and accurately than traditional methods. This also reduces processing time and potential human error. The tool features a highly precise linear stage that enables scans to cover the entire surface of the wafer with a high level of accuracy. Simultaneously, the asset is able to choose different heights for the lens to lift off the wafer surface for different levels of inspection. The intuitive user interface simplifies interaction with the model and provides an easy, efficient way to set up and initiate scans. A reporting equipment also allows users to catalog any irregularities that were discovered during a scan and store them for future reference. INS3300 comes with a range of accessories, such as a programmable LED display and software tools to facilitate the integration of the system into existing workflows. With a range of industry certifications, including the ISO9001, this unit ensures that semiconductor manufacturers receive the highest quality inspection services available.