Used LEICA / VISTEC 3300 #9237527 for sale

LEICA / VISTEC 3300 is a leading-edge, advanced mask & wafer inspection equipment for the semiconductor production industry. Developed between LEICA and VISTEC and specifically designed for the rapid and cost-effective detection of defects in wafer and mask alignment steps, LEICA 3300 offers unprecedented levels of accuracy and automation. The system is composed of several components, including a state-of-the-art digital camera, a multi-axis stage, and a high-precision guide arm, all working together to provide full coverage of a wafer or mask surface. The digital camera utilizes a patented filter array technology, combining high-resolution imaging with different wavelengths of light to detect even the smallest defects. Additionally, a point detection algorithm, developed in-house, searches for defects on the wafer or mask and provides uninterrupted scanning for rapid defect evaluation. The stage is built using linear bearing rails and is fully programmable for automated alignment of the wafer or mask in different views. It also offers incredible repeat accuracy for precise inspection. The guide arm is an advanced-design patent-pending mechanism, offering precise alignment and handling of the mask or wafer for optimal scanning conditions. The arm also has an electric servo motor for precise speed and motion control. In addition to these components, the unit also includes powerful software for image processing and defect analysis. It includes several features such as automatic alignment, 3D image stacking, color coding, auto-calibration, pattern-matching, and an intuitive process control machine. All functions are designed to provide the highest performance in the wafer and mask inspection process. VISTEC 3300 tool is the perfect choice for any semiconductor production operation looking to increase efficiency and accuracy while reducing costs. Its advanced design and features ensure accurate and reliable inspection, allowing for improved yields and higher quality results.