Used LEICA / VISTEC INS 1000 #10628 for sale

LEICA / VISTEC INS 1000
ID: 10628
Automated Wafer Inspection systems.
LEICA / VISTEC INS 1000 is a high-accuracy mask and wafer inspection equipment designed to provide high resolution and accurate measurements of circuit features in a variety of applications. The system features a high-resolution CCD camera, a laser, and optics unit to allow optimum inspection of wafers at high speed. Improvements over the previous version of this machine include faster measurements and a higher resolution. LEICA INS 1000 uses a 1.8K-pixel CCD camera with a 1.4 micron pixel size and a maximum resolution of 0.75 μm, enabling it to detect small defect features on the wafer surface. The laser is capable of measuring a few nanometers with an accuracy of 0.2 μm. The tool also provides the ability to easily acquire an image of a particular area of the wafer where analysis needs to be done. This helps to quickly review any defects without having to move the entire wafer in between measurements. Additionally, the asset offers three axes of motion relative to a feature and allows the operator to move to compensate for different rotational angles of a feature. The software included with the model allows users to quickly review the results of their measurements, as well as generate reports. Reports can be generated in a range of formats such as pdf or jpg for easy viewing, or can be exported to other formats for further analysis. In addition to wafer inspection, the equipment can also be used for failure analysis. The software can analyze images of any type from the device under test and identify any potential defects or errors. It further provides the ability to compare test results over time to spot and compare trends. Overall, VISTEC INS1000 offers precise and accurate measurement of features on a wafer, enabling high-quality recordings of defects and failure analysis in a variety of devices and applications.
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