Used LEICA / VISTEC INS 2000 #9308872 for sale

LEICA / VISTEC INS 2000 is a precision mask and wafer inspection equipment designed specifically for the semiconductor industry. It offers advanced features, such as high-resolution imaging and automated defect inspection, that help to ensure the highest quality standards in the production of semiconductor devices. LEICA INS 2000 is a fully automated system that utilizes powerful optical and image processing technology to detect and measure defects and imperfections on masks and wafers. The unit offers high-resolution imaging and advanced image analysis, allowing for the detection of small defects and contaminants on both masks and wafers. Additionally, the machine offers automated defect inspection capabilities, which can be customized to meet the specific requirements of the process and user. VISTEC INS 2000 can be configured to perform both full-field and targeted mask and wafer inspection. With full-field inspection, the tool can scan the entire field at once and detect even the smallest defects. For targeted inspection, the asset can be configured to inspect only selected areas or regions on the masks and wafers. In addition to its inspection capabilities, INS 2000 offers advanced features, such as defect review and SPC (Statistical Process Control) functionality. With defect review, users can look into and analyze defects at a detailed level, allowing them to make informed decisions about production processes. The SPC functions allow users to monitor process performance and detect any potential issues or defects. LEICA / VISTEC INS 2000 is an exceptional tool for ensuring the quality and reliability of semiconductor devices. It offers advanced optical and image processing capabilities, enabling it to detect even the smallest defects and ensures that no quality issues or contaminants go undetected. With its automated defect inspection capabilities, users can be confident that they are meeting the highest quality standards in the production of their devices.