Used LEICA / VISTEC INS 2000 #9309162 for sale

LEICA / VISTEC INS 2000 is a sophisticated mask and wafer inspection equipment designed to support automated production of ICs, MEMs and other microelectronic components. It can provide inspection of critical process nodes, complete wafer maps for yield and die sorting operations. LEICA INS 2000 uses an optical microscope to achieve up to 4,500X magnification of each wafer layer for detailed inspection and characterization of the image pattern. Its state-of-the-art CCD cameras are able to capture clear images from any given layer, achieving a resolution as fine as 0.1 μm. The system also comes equipped with a software package specifically tailored for automated inspection, allowing for rapid and accurate review of the images. VISTEC INS 2000 features a fully automated handling unit, which can move and position both mask and wafer pattern layers in order to execute error detection and correction. It also provides a variety of parameters for inspection, including sizing, operation evaluation, pattern registration and line-end/junction checking processes. In addition to its advanced technological capabilities, INS 2000 also offers an efficient production stream, supplying customers with detailed examination of their process output in a short amount of time. It can provide quick and reliable feedback, allowing customers to further improve the production process while minimizing losses. Finally, LEICA / VISTEC INS 2000 is capable of interfacing with a variety of instruments, facilitating communication between systems and expanding its application range. Furthermore, the machine is backed by industry-leading customer service and technology support, allowing for efficient maintenance of the tool and timely resolution of any technical issues.