Used LEICA / VISTEC INS 3000 #9236858 for sale

LEICA / VISTEC INS 3000 is an Automated Optical Inspection (AOI) equipment designed for mask and wafer inspection. This innovative system is designed for the demanding requirements of wafer processing and sub-100nm lithography. It is a reliable and cost-effective unit, capable of handling a high throughput with uniform consistency. The machine can detect and identify defects with 3D reconstruction capabilities, integrating sensitive inspection with defect analysis features. Its motorized Z axis allows for various stages of inspection, such as zoom, pan, focusing and automated calibration. It also provides clear defect images at pulse levels. LEICA INS 3000 utilizes advanced and advanced optics, with three cameras situated on the Z-axis of the wafer, making it suitable for any inspection job. With an integrated image formation and pattern matching engine, the tool maximizes inspection efficiency with its high-speed scanning, accurate and repeatable results, and easy operation. The asset features a capillary vision model with integrated mask alignment program to facilitate defect position capture and correction. The dynamic imaging mode helps with the analysis of defects, along with the ability to perform 3D image processing to recognize, classify and size defect features. The equipment also features a wafer alignment system, with integrated programs for wafer identification, calibration and distortion correction. A custom software tool enables pattern matching with user-defined labels and the dynamic defect capture feature helps in reconstructing the image of a wafer from data captured across various design layers. Overall, VISTEC INS 3000 is an intuitive and powerful unit for mask and wafer inspection that can meet any production requirement with its efficient manner. This multi-faceted inspection machine provides superior results with its integrated software packages, advanced imaging options and advanced optical characterization. The tool utilizes automated and sensitive inspection with defect analysis capabilities to provide uniform and economical results.