Used LEICA / VISTEC INS 3000 #9238317 for sale

LEICA / VISTEC INS 3000
ID: 9238317
Wafer Size: 8"
Vintage: 2000
Wafer inspection system, 8" 2000 vintage.
LEICA / VISTEC INS 3000 is a mask and wafer inspection equipment designed for the most demanding applications. It is a fully-automated inspection system that can achieve high throughput rates and incorporate best-in-class optics and illumination to enable maximum defect detection. The unit is equipped with a precise alignment and focus control machine that ensures precise inspection accuracy. The tool also incorporates an integrated sample loading and positioning asset that allows for efficient loading and unloading. The model allows for both 2D and 3D inspection, giving it the capability to inspect topographies of a wide variety of substrates including masks, wafers, and substrates of various other dimensions. Its advanced optics and illumination allow for the capability to detect extremely small defects down to 0.5 micron. This level of sensitivity is unmatched in the industry, enabling high sensitivity inspection that can detect abnormality down to the level of individual dies which allows for faster confirmations of the desired defect free quality. LEICA INS 3000 also supports in-transport and on-clamp sample handling, enabling the ability to streamline the process flow and reduce the time needed for sampling, loading, unloading, and positioning. It is also equipped with user-friendly software that allows for high customizability and flexibleparameter settings, allowing easy integration into existing inspection lines. Its patented Sub-Angle Imaging Technology provides a comprehensive overview of the sample, capturing the sample in all directions from multiple angles. This eliminates the need for manual sample rotation, creating a more efficient inspection process that also helps in quicker identification of possible defects. VISTEC INS 3000 is an ideal solution for mask and wafer inspection applications, due to its flexibility, sensitivity, and throughput potential. It is a reliable and high performing solution that provides superior defect detection performance, all while streamlining the inspection process and optimizing the equipment workflow.
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