Used LEICA / VISTEC LDS 3000 #9237522 for sale

LEICA / VISTEC LDS 3000
ID: 9237522
Wafer Size: 8"
Defect inspection system, 8".
LEICA / VISTEC LDS 3000 is a mask and wafer inspection equipment that is designed to accurately inspect and evaluate optical masks, phototools, and wafers and can be used for the manufacture of integrated circuits (ICs and other high-precision components. The system has integrated advanced image analysis and visualization capabilities, allowing operators to easily identify defects on various types of masks and wafers. The unit uses an industry-leading imaging machine and technology to provide highest-level performance inspection for both mask and cross-sectional imaging of wafers. It features a unique 18-inch flat-panel monitor and a phosphor-coated, high-resolution optical microscope for superior image quality. It is user-friendly and offers multiple options for quick and easy operation. The resolution of optical magnification is up to 100X, and the resolution of scanning electron microscope (SEM) imaging is up to 1000X. The tool is equipped with automated patterning capabilities for generating optimized defect inspection criteria. LEICA LDS 3000 also enables the user to create special defect parameters for improved accuracy and enhanced efficiency. It allows the user to customize the wafer inspection process, from image processing to defect verification. Additionally, the built-in high-resolution imaging and automated pattern recognition help ensure accurate masks and wafers. The asset can also measure a variety of critical sizes and dimensions, such as line widths, die size, and notch length. Furthermore, it provides special defect data management capabilities such as library comparison, false alarm screening, and defect history storage. For mask and wafer alignment, VISTEC LDS 3000 uses a fully automated robotic vision model. This equipment is accurate to within microns, and can align intricate registration marks and structures accurately. Furthermore, the built-in database tracking allows the user to keep track of all defect and inspection activities. In conclusion, LDS 3000 is a reliable and powerful mask and wafer inspection system, designed to meet the requirements of the most demanding application. Its advanced features and capabilities allow the user to achieve superior results quickly and easily.
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