Used LEICA / VISTEC LDS 3300M #9249376 for sale

ID: 9249376
Vintage: 2007
Automated defect inspection system 2007 vintage.
LEICA / VISTEC LDS 3300M is a modern mask and wafer inspection equipment designed to provide high resolution imaging for a variety of inspection processes. It is ideal for IC packaging, lithography, front side print and photomask evaluation. The system is equipped with an SCM48x objective with a motorized focus, and an 8" High Dynamic Range (HDR) camera, which ensure accurate imaging of intricate components. The improved light source is based on PolyLED technology with LEDs having a spectral bandwidth of 370nm-900nm, providing superior imaging performance as well as long lifetime. In addition, LEICA LDS3300M is equipped with an X-Y-θ stage, allowing for rapid location and precise positioning. A high speed, vision-based alignment feature is also included, allowing the unit to scan any regular or irregular shaped target within a few seconds. The machine can take high definition images in both upward and downward directions at multiple angles and depths. VISTEC LDS 3300 M can be connected to a PC to process and analyze data collected from inspection. The tool also supports data import and export formats such as TIFF, JPEG, BMP, and other image processing formats. The asset comes with user-friendly image analysis software that provides comprehensive mask inspection and wafer evaluation with defect detection and inspection yield analysis. The software also offers visual feedback in the form of false color plotting as well as various filtering techniques for both the data and images. LDS 3300 M is capable of detecting and correcting deformities in masks, photomasks and wafers down to 4 μm, ensuring accuracy and reliability of inspections. The model also supports multiple languages and can be customized to accommodate any business-specific requirements. Overall, LEICA LDS 3300M is a top-of-the-line mask and wafer inspection equipment that offers high resolution imaging, automated positioning, false-color plotting and yield analysis. It is ideal for a wide variety of applications, ensuring accurate and reliable results.
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