Used LEICA / VISTEC LMD #178327 for sale

LEICA / VISTEC LMD
ID: 178327
Laser Microdeissection System, crated.
LEICA / VISTEC LMD is an industry-leading mask and wafer inspection equipment designed to deliver high performance metrology for automated production processes. Utilizing advanced technology including Fully Automated Multi-Directional Alignment (FAMA), this system provides the highest level of precision image analysis and defect detection for increased accuracy. LEICA LMD unit offers automated multi-directional alignment and registration that gives users a choice of 7 alignment points per site. This improved positioning accuracy helps to reduce OPC errors and maximize line performance. VISTEC LMD also contains a built in common user interface which ensures consistent performance across different sites, with fast and reliable operation. LMD includes an array of automated inspection tools, coupled with a high-resolution imaging machine to help users quickly identify defects, allowing for correction before the part is shipped. The tool as a whole is designed to streamline the production process and reduce the number of manual steps needed to ensure accuracy. LEICA / VISTEC LMD also features a suite of control applications that enable users to customize their inspection workflow for the specific needs of their individual operations. This includes a Defect Review software package which allows operators to trace, characterize, tag and review defects in real-time for a quality assurance assessment. Additionally, the asset is capable of processing multiple layers of CDs in a single pass, providing users with a streamlined approach to multi-layer part inspection. LEICA LMD offers high performance imaging and metrology capabilities at a fraction of the cost of other systems. The all inclusive inspection suite of the model helps to reduce manual processes, while still achieving the standards necessary for producing reliable and high-quality products. This equipment is the ideal choice for ensuring quality assurance, defect detection and high throughput at the same time.
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