Used LEICA / VISTEC MIS 200 #9238023 for sale

LEICA / VISTEC MIS 200 is a mask and wafer inspection equipment designed for use in the fabrication of microelectronic devices. It features a digital microscope with a high-resolution color LCD display, advanced high-resolution imaging, and powerful algorithms for automated detection of defects on masks and wafers. The system offers image capture and manipulation in both 2D and 3D modes, allowing for comprehensive analysis of the microelectronic component. By pairing this unit with the advanced algorithms of LeitzLEICA proprietary software, users can accurately and quickly detect both foreign and domestic faults within the microstructures on a given device. The machine also provides a wide field of observation for viewing large photo-mask or wafer areas, allowing for easier comparison to product standards. The use of high-resolution digital images combined with the powerful software algorithms allows for radial and zonal scanning, with simultaneous comparison between the digital images and Design-for-Inspection (DFI) data. This enables the user to accurately identify and quantitatively measure any defects that may be present. The tool includes an intuitive graphical user interface, allowing for simple selection between various modes, gauges, and image capture parameters. It provides an easy to use setup menu, in which users can select the desired parameters for automated analysis and data collection. It also includes an automated production mode for fast and efficient analysis of large photo-mask and wafer areas. Performance features of the asset include: improved digital focus capability; high speed imaging; multiple viewports; and zoom level up to 2500x. The digital image capture works well in both brightfield and darkfield imaging modes. The model can perform automated shadow and binary edge detection, automated material presence tests, register control tests, and gap analysis. In summary, LEICA MIS 200 is a powerful and intuitive high-resolution mask and wafer inspection equipment with advanced features that simplify the inspection process and provide accurate detection and quantitative analysis of defects on microelectronic components. This system is suitable for automated production applications, as well as manual inspection scenarios.