Used LEITZ Ergolux #77138 for sale

ID: 77138
Trinocular microscope, 6x6 stage, 12.5 Periplan eyepieces, NPL5, 20 and 50 df motorized turret and laser focus, with a 100 watt illuminator.
LEITZ Ergolux is a revolutionary mask and wafer inspection equipment designed for the needs of the modern semiconductor industry. It is used for the inspecting of photomask, reticles, and wafers. Possible defects can range from microscopic particles of dust to larger anomalies such as chips, pits or structural damage. Ergolux is a versatile and feature-rich system that holds great potential to save cost, while at the same time increasing the production quality of your endproducts. LEITZ Ergolux is equipped with the latest in scanning technology, allowing it to capture high-resolution images of photomask, reticles and wafers. With an adjustable inspection speed of up to 200GHz, inspections can be completed within seconds. It is equipped with an 8MP image gathering unit, allowing it to accurately capture even the smallest of details. The machine also integrates a highly sensitive optical sensor, capable of detecting defects up to 5μm in size. In addition to its impressive scanning capabilities, Ergolux also integrates powerful defect detection algorithms. By analyzing the acquired images, the tool can identify a wide variety of defects, ranging from pits and chips to fiber-strands and particles. The asset also offers a complete reporting model, allowing you to quickly gain insight into the yield of your production. In addition to its impressive features, LEITZ Ergolux is also incredibly easy to operate. It comes with a user-friendly touch screen interface, making it easy to customize the settings of the equipment. It also has an integrated data management system, conveniently allowing you to store and recall both settings and images. Overall, Ergolux is a revolutionary mask and wafer inspection unit, capable of meeting the needs of virtually any semiconductor production facility. With its advanced scanning capabilities and powerful defect detection algorithms, it offers increased yields while saving cost. Furthermore, its easy-to-use interface makes it an ideal choice for a wide range of applications.
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