Used LTX-CREDENCE / OPTONICS Emiscope II #293655589 for sale

LTX-CREDENCE / OPTONICS Emiscope II is a state-of-the-art mask and wafer inspection equipment dedicated to the successful probing and visual assessment of integrated circuits (IC) during the semiconductor fabrication process. It is an advanced automation platform combining a 50mm field of view 10x macro inspection system with an optically-coupled wafer microscope that is specifically designed to accurately evaluate the ICs during wafer probing, die-to-die imaging and wafer surface measurement. At the heart of the unit is a high magnification zoom lens with a range of one to ten times magnification with ease of operation at any magnification, and a variable field of view. With the Emiscope's unique optical design, the user can easily adjust the lens zoom and field of view to their desired size. The machine also incorporates an intuitive front-end interface and advanced software that enables the user to easily set parameters and control the tool setting as required. The asset is further equipped with a high-resolution digital camera component that is optimized for the specific application. Additionally, the digital camera technology employs a digital signal processor (DSP) for maximum data extraction capabilities. This ensures accurate data collection for the best results. In order to improve the accuracy and reliability of the mask and wafer inspection process, OPTONICS Emiscope II offers a variety of advanced features to improve the yield rate. These features include a unique defect pattern inspection or a defect review tool, which allows the user to accurately and effectively detect the exact location of the potential defect on the wafer. The wafer review software also provides statistical information regarding the defects and the number of defects spotted. Furthermore, the model also provides the user with the ability to define defect types and thresholds in order to get the most out of the equipment. LTX-CREDENCE Emiscope II is also equipped with an array of optical components and software tools that enable the user to automatically detect and categorize defects during the inspection process, allowing for a smoother process and faster results. Additionally, the automated workflow of Emiscope II is designed to minimize any human errors by decreasing the risk of incorrect operation and errors. Overall, LTX-CREDENCE / OPTONICS Emiscope II is a highly reliable and efficient mask and wafer inspection system that offers unparalleled performance and accuracy with excellent user interface and software components that enable an efficient inspection process. The unit is ideal for any IC manufacturing facility that seeks to promote the highest quality product while at the same time minimizing costs and risks.