Used MATSUSHITA M777 #9329275 for sale

MATSUSHITA M777 Mask & Wafer Inspection Equipment is a high-precision opto-mechanical metrology instrument designed specifically for the inspection of semiconductor wafers and photomasks. It uses a half-inch telecentric lens to image the target samples, with a resolution of 1 micron or better. Images of the sample surface are taken at multiple off-axis magnifications, allowing for comprehensive surface inspection and analysis. M777 employs a variety of optical imaging techniques to perform its inspection process, such as laser interferometry, achromatic imaging and phase-measurement. This allows for high-resolution analysis of the wafer surface, enabling precise measurements of feature size, surface features, and particle contamination. The system is equipped with a self-contained self-calibration unit that will allow a repeatability of measured results of better than 10 nanometers. The machine features a wafer mapping function, allowing for the tracking of wafers during their inspection progress. Additionally, a defect database can be programmed into MATSUSHITA M777 to track defect areas for later review and characterization. The tool is able to capture extremely fine surface details, such as chip topology and feature placements, as well as features that are too small to be resolved in a microscope. This enables the analysis of high precision wafer structures with a resolution of less than one nanometer. M777 asset is also designed with safety features to protect both users and the instrument itself. It has an ESD-protected internal environment and a built-in reflective/non-reflective door design to prevent light from leaving the inspection area. It also features a dedicated cooling circuit, offering protection against overheating of the model during operation. MATSUSHITA M777 equipment is a truly exceptional metrology instrument for inspecting semiconductor wafers and masks. Its optical imaging techniques allow for the utmost accuracy in surface analysis, and its built-in safety features provide enhanced protection whilst in operation. With its ease of use and superior performance, M777 Mask & Wafer Inspection System is an excellent choice for advanced semiconductor metrology.