Used MATSUSHITA PSX307-M #9394953 for sale

MATSUSHITA PSX307-M Mask & Wafer Inspection Equipment is an advanced, high-performance system for conducting defect inspection of semiconductor masks and large-size wafers. The unit utilizes advanced optical double-pyramid deflectometry (DOE) technology to accurately measure the shape and surface of each semiconductor device, enabling detection of critical defects and their precise locations. An on-board, high-resolution camera is integrated with the machine for image capturing of the inspected wafer or mask, and superior imaging capabilities enable inspection of even the finest details. The tool also takes advantage of advanced three-dimensional optical sensing technology (3D & OS) for comprehensive defect finding and measurement. With this advanced asset, it is possible to detect small defects on wafers and masks, as well as to accurately measure surface shape, height, and other physical characteristics. This data can be used to measure the size and shape of a device to ensure precise quality control. PSX307-M is equipped with a built-in auto-alignment function that works in unison with the 3D & OS model to enable precise defect inspection. This auto-alignment feature allows for the detection of minute defects with high accuracy, even in large wafers. Furthermore, the equipment is equipped with an advanced image analysis tool (MATMESH) that performs real-time defect elimination for high-efficiency defect inspection. MATSUSHITA PSX307-M also features a variety of user-friendly menus and functions which allow for the operation to be carried out with ease. The system is equipped with a manual operation mode as well as an automatic operation mode, enabling operation to be tailored to users' needs. In addition, the support of various programming languages allows users to develop custom inspection programs for specific needs. In summary, PSX307-M Mask & Wafer Inspection Unit is an advanced, high-performance machine for conducting defect inspection of semiconductor masks and large-size wafers. Utilizing advanced optical and three-dimensional sensing technology, the tool is capable of detecting minute defects with high accuracy, while its built-in auto-alignment and image analysis features serve to further enhance operational efficiency. With its various user-friendly menus and functions, MATSUSHITA PSX307-M is an excellent choice for automated mask and wafer inspection.