Used MCBAIN SYSTEMS DDR-300 NIR #9180196 for sale

MCBAIN SYSTEMS DDR-300 NIR is a Mask & Wafer Inspection equipment that provides automated inspection of wafers and masks. It features a state-of-the-art system design, optimized for production applications. The heart of DDR-300 NIR is an advanced high-speed camera that records infrared light passing through a wafer or mask. This advanced imaging unit quickly scans the pattern on the device and then compares it with known patterns, to detect anomalies in the structure or features of the pattern. MCBAIN SYSTEMS DDR-300 NIR can inspect both wafers and masks. With wafer inspection, the machine performs a non-contact check on the surface uniformity and structure of the wafer. In mask inspection, the tool uses its infrared receptors to capture and compare the pattern, layer-by-layer, to the original pattern designed, effectively identifying discrepancies. DDR-300 NIR features several additional features to optimize the defect detection. The asset uses advanced algorithms and image processing techniques to accurately detect and distinguish between nearly imperceptible defects, reducing inspection time and providing results with greater accuracy. MCBAIN SYSTEMS DDR-300 NIR supports a variety of wafer photography formats and can automatically detect and adjust the required parameters. The image acquisition process is quick and efficient, so that production cycles are rapid and reliable. The user-friendly interface on DDR-300 NIR includes intuitive touch menu navigation and customizes commands that can be set up quickly. The model also automatically saves tested data and measured images on its SD memory card, allowing data to be quickly retrieved for review and analysis. The equipment also has an I/O board and LCD touch screen that allows fast communication between the system and the client, for quick on-site updates. MCBAIN SYSTEMS DDR-300 NIR Mask & Wafer Inspection unit is designed for fast, reliable and cost-effective process control. The machine meets all industry safety and quality standards, providing an efficient solution for production line quality control. With its advanced imaging capabilities, precise defect detection, intuitive user interface, and wide range of supported wafer photography formats, DDR-300 NIR is an essential tool for any production line.