Used MCBAIN Z-Scope #9276209 for sale

MCBAIN Z-Scope
ID: 9276209
System OLYMPUS BHMJ Trinocular inspection measuring microscope included.
MCBAIN Z-Scope is an advanced mask and wafer inspection system designed to meet the rigorous requirements of the semiconductor industry. Its advanced capabilities include automated wafer and mask inspection, both visual inspection and height measurements, as well as full control of the microscope parameters, including focus and illuminator type. Z-Scope features a unique combination of: a high speed motorized X-Y-Z stages, a high-resolution CCD (charge-coupled device) camera with an adjustable zoom lens, highly reliable integrated hardware and software, a large 13" LCD touch screen monitor, and a proprietary software suite. The motorized stage allows the microscope to be moved quickly and accurately through the mask or wafer. The high accuracy CCD camera and adjustable zoom lens enable high resolution views of the device under investigation. The integrated hardware and software allow the user to control the microscope's parameters precisely, providing the user with the ability to detect very small areas of discrepancy or defects on the mask or wafer. The large 13" LCD touch screen monitor allows for a large view of the device under investigation. The proprietary software suite allows for a variety of measurement and analysis features, including full visualization of the data, comparison of data sets, and an intuitive user interface. MCBAIN Z-Scope offers reliable and accurate results both in terms of wafer and mask inspection, as well as providing an easy to use and intuitive software suite. The system's reliable and high performance features enable the user to find defects or discrepancies quickly and accurately, improving production times and increasing throughput overall. Its ability to inspect wafers and masks with great precision ensures the quality of manufactured products is maintained.
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