Used METRICON 2010 #9246090 for sale

METRICON 2010 is a state-of-the-art automated Mask and Wafer Inspection equipment designed to meet the highest standards in semiconductor inspection. This system uses advanced pattern-matching and optical microscopy technology to discover and classify mask defects and wafer contamination with unmatched accuracy. Using advanced algorithms, 2010 is able to scan a wafer with highly accurate resolution, allowing it to detect defects down to 1/100 of a micron. Proprietary lighting solutions are also available to enable METRICON 2010 to accurately identify even the smallest of defects in any inspected wafer. The unit provides an effective detection rate for particles above 0.2um and submicron flaws up to 0.5um thanks to its 12MP camera technology. In addition to providing a tight focus over the entire wafer, 2010 also adheres to industry-standard cleanroom configurations, as well as advanced fault isolation features, which allow defective areas to be quickly identified and troubleshooted. This helps to ensure a high yield of on-spec parts along with increases in process efficiency. Other features of METRICON 2010 include high-speed scanning for whole mask inspection, and an intuitive GUI that allows for a visual representation of defect locations. By showing defect attributes such as size, shape, location and orientation, this adds a higher level of accuracy in defect classification. The automated and multi-functional nature of 2010 machine make it an ideal choice for high-throughput production, providing cost-effectiveness and improved efficiency throughout the mask and wafer inspection process. This advanced tool is designed to deliver superior accuracy and performance to help meet the challenges of today's fast-growing semiconductor industry.