Used MIT Linearflex 822 #9234972 for sale

MIT Linearflex 822 is a mask and wafer inspection equipment designed to provide automated, non-destructive evaluation of integrated circuits (ICs). The system consists of a combined optical and scanning electron microscope (SEM), as well as advanced software tools that automate the inspection process. The optics unit includes a bottom-illumination objective lens, providing crisp, real-time image captures of the wafer surface. With scanning electron microscopy (SEM), sub-micron features can be imaged at very high levels of detail. High-resolution images can be captured in multiple channels as phased-array imaging, allowing for the inspection of both surface and subsurface features of the IC. Linearflex 822 also includes powerful image analysis capabilities that enable automated inspection of wafers at all stages of the IC design and manufacturing process. Advanced image processing algorithms are capable of identifying defects at both macroscopic and microscopic levels, including particle and particle clusters, nodules, pits, scratches, and other contamination. In addition, the machine includes a suite of wafer inspection tools for comprehensive detection of a full range of lithographic printing errors. The suite is compatible with a range of industry-standard lithography processes, including step-and-scan (i-line stepper or DUV scanner), double-patterning, and photomask processing. The software is also capable of detecting foreign objects and wafer peeling or warping. In combination with the image capture systems, the automated inspection software provides comprehensive screening and measurement of IC layouts and processes. It can be used to detect process faults, locate contamination sources, and help optimize process performance. The integrated tool software is designed to minimize downtime and optimize performance. The software is highly extensible and can be programmed to enable wafer test and repair processes. It is capable of handling large datasets with high-speed data streaming from the hardware. MIT Linearflex 822 is an advanced mask and wafer inspection asset designed to streamline IC production and increase throughput. It combines high-resolution imaging with sophisticated software tools to provide reliable, automated inspection of ICs at both macroscopic and microscopic levels. With its robust design and comprehensive tools, the model is well suited for IC design and manufacturing applications.