Used NANOMETRICS 200 #9199415 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

ID: 9199415
Film thickness measurement system NanoSpec AFT 7001-092 Ultra spec III Controller 7201-1045 with remote keypad 0156-000 Printer Light source Objectives.
NANOMETRICS 200 is a mask and wafer inspection equipment that provides advanced image capture, analysis and visualization capabilities. Its scanning technology is capable of capturing high resolution images on masks and wafers with an unprecedented level of detail. The system's physical components consist of a light source, scan head, lens, electronic unit and a controller. Its optics component consists of an optical filter, focusing objective lens, zoom lens and focusing optics. The light source delivers UV, white and IR lighting to imaged specimens on a wafer or mask. The scan head is designed to capture the image signals produced by the light source and lens. The lens, combined with the imaging optics and filter, are used to produce a highly detailed image to be analyzed. The electronic component of the machine is used to automatically process the images. It features advanced image recognition, object counting, feature recognition and Tilt & Rotate algorithms that can detect and identify any feature on a mask or wafer. Additionally, it has tools to automate the analysis and interpretation of results, making it easier to compare images over multiple facets. 200 also includes an advanced image visualization feature that enables users to view a detailed image at various angles and zoom levels. This allows for easy identification and analysis of areas of interest. The tool's graphical user interface (GUI) enables users to easily access and control all its features. Overall, NANOMETRICS 200 is a comprehensive mask and wafer inspection asset that offers advanced image capture, analysis and visualization capabilities in a simple, easy to use package. Its powerful optimization and analysis tools, combined with its intuitive interface, enables users to quickly review and compare detailed image data of complex mask and wafer structures.
There are no reviews yet