Used NANOMETRICS 4000 #9284341 for sale

NANOMETRICS 4000
ID: 9284341
Film thickness measurement system.
NANOMETRICS 4000 is a mask and wafer inspection equipment that provides advanced, high-performance detection and analysis of defects that would otherwise go undetected. It is equipped with an advanced optical system, allowing it to detect microscopic defects without requiring higher levels of resolution. 4000 optically detects masks, photomasks, lithography reticles, and wafers with an exceptional level of accuracy and precision. The unit is based on an advanced, widefield Automated Optical Inspection (AOI) machine, allowing it to detect more defects on different surfaces, across larger areas, using fewer resources. The tool is capable of automatically demonstrating thorough inspection coverage, while also providing the user an improved screening method. Its linear, dual-zone technology offers a truly seamless map of the surface, enabling it to detect defects on even the most challenging surfaces. NANOMETRICS 4000 is optimized for use in semiconductor device manufacturing environments, providing exacting surface measurements, reliable defect detection, and traceable production data. It is capable of recognizing a wide range of defects, such as scratches, small particles, short defects, laminate defects, and foreign material, as well as pits, non-uniform etch pits, and voids. It will also detect moisture and contaminants, providing a comprehensive analysis and ultimate detection accuracy. The asset is designed with intuitive user experience and high productivity in mind. Various features provide unparalleled performance, such as the Quick Reference tool, which provides an overview of the sample or product before proceeding with inspection, and the Referenceless Image Search tool, which allows users to quickly locate known defects without having to reference reference images. 4000 is designed for high volume production and is outfitted with a host of automation features, such as automated process recipes, automated results collection, batch process scheduling, and continuous process control. It also offers real-time monitoring capabilities, allowing manufacturers to track critical production yields and optimize throughput. Furthermore, its high resolution and advanced optics allow it to deliver high accuracy measurements and results. Ultimately, NANOMETRICS 4000 is a powerful, reliable tool for mask & wafer inspection, allowing manufacturers to keep pace with the ever-increasing need for higher-quality components. Its intuitive user experience, comprehensive defect detection capabilities, and automated features ensure high-volume production and reliable, traceable results.
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