Used NANOMETRICS 4150 #9188635 for sale

NANOMETRICS 4150 is a state-of-the-art mask and wafer inspection equipment designed to identify and analyze defects, contaminants, and non-uniformity in semiconductor materials. The system offers enhanced performance and innovative features, facilitating quick and easy monitoring of the quality of masks and wafers during dice and after etching. The unit utilizes a unique DualFarfield Interferometer (DFI) that combines two laser beams in the interferometer's cavity. The two laser beams are aligned along two linear axes, providing a 3D image of a mask or wafer. The machine analyzes the resulting image, detecting even the slightest variations in shape, size,and position. Using its powerful software, 4150 tool can compare a current wafer or mask to a stored reference, looking for any contaminants, sharp edges, cracks, and other defects. The asset also utilizes pattern recognition algorithms that analyze and calculate the exact correlation between a reference and a current pattern. Meanwhile, advanced noise filtering tools use statistical methods to reduce noise, such as thermal drift and electronic noise. The model's intuitive user interface allows users to effortlessly scan a mask or wafer and examine results in real-time. Furthermore, the equipment provides a range of compatible accessories that facilitate precise image acquisition and efficient data analysis. These include high-resolution lenses, wafer mount frames, automated surface plates and more. In addition to its impressive hardware and powerful software, NANOMETRICS 4150 also includes user-friendly documentation that allows users to easily learn the system's functionalities and become proficient quickly. With optimal ergonomics and reliable results, 4150 is a top-of-the-line unit that enables users to ensure precise quality control and ensure optimal device yields.