Used NANOMETRICS 8000XSE #9384474 for sale
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ID: 9384474
Wafer Size: 8"
Vintage: 2000
Film thickness measurement systems, 8"
2000 vintage.
NANOMETRICS 8000XSE is a world-class equipment dedicated to mask & wafer inspection, specifically designed for front-end semiconductor processes. It uses state of the art optics, a sensitive linear stage and an ultra-low noise imaging sensor to achieve sub-nanometer accuracy. Using proprietary, patent-protected algorithms, NANOMETRICS 8000 XSE quickly and reliably detects and inspects wafer and mask features and defects. It features an advanced optical design that eliminates vibration, and a specialized imaging technology that improves sensitivity and speed. For mask inspection, 8000XSE scans the entire exposed wafer surface using a low-noise imaging system. It inspects edges, corners, and other anomalies that cannot be seen by human eye, and then checks for accuracy and cell fidelity. It can also inspect up to 5 µm critical dimensional features in the mask-defined area. For wafer inspection, 8000 XSE uses the same panoramic imaging technology, but with an even higher accuracy. It uses a series of powerful algorithms to calculate important parameters such as CD (critical dimension) and OPC (optical proximity correction). The unit is capable of detecting deepest defects up to 0.2µm. For both mask and wafer inspection, NANOMETRICS 8000XSE offers an automated review process which reviews and approves each scanned image. It also offers an automatic pass/fail analysis of the scanned image, utilizing real-time analysis as well as stored reference images. For added convenience, the machine can be controlled remotely through an intuitive web interface. This user-friendly interface provides real-time access to all the relevant data, settings, and scan results. In conclusion, NANOMETRICS 8000 XSE tool is a cutting-edge inspection asset dedicated to semiconductor fabrication processes. It offers high accuracy, reliability, and speed, and it is the perfect choice for those looking for a comprehensive mask & wafer inspection model.
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